XF, Zhang QF, Song FQ, Wang BG, Wang BL, Xu YB, Wang GH, · 2019. 10. 31. · National Lab of Solid...
Transcript of XF, Zhang QF, Song FQ, Wang BG, Wang BL, Xu YB, Wang GH, · 2019. 10. 31. · National Lab of Solid...
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南京大学固体微结构物理
国家重点实验室
主 任 陈延峰
副主任 王强华
桑 海
刘 辉
殷 江
实验室
办公室主任
实验室
主任助理
张文俊
郝西萍
吴 军
地 址: 南京市汉口路 22 号
邮 编: 210093
电 话: 86-25-83592756
传 真: 86-25-83595535
Email: [email protected]
网 址: https://vlssm.nju.edu.cn
目 次
实验室概况………………………………………………………………………………………………….. 1
第八届学术委员会委员名单…………………………………....................................... 2
2015年实验室工作总结…………………………………………………………………………… 3
2015 年优秀论文精选 (Selected papers published in 2015)………. 24
1 Liu EF, Fu YJ, Wang YJ, Feng YQ, Liu HM, Wan XG, Zhou W, Wang
BG, Shao LB, Ho CH, Huang YS, Cao ZY, Wang LG, Li AD, Zeng JW,
Song FQ, Wang XR, Shi Y, Yuan HT, Hwang HY, Cui Y, Miao F, Xing
DY, Integrated digital inverters based on two-dimensional anisotropic
ReS2 field-effect transistors, Nature Communications 6, 6991 (2015)..
25
2 Wang R, Zhang CF, Zhang B, Liu YL, Wang XY, Xiao M, Magnetic
dipolar interaction between correlated triplets created by singlet fission
in tetracene crystals, Nature Communications 6, 8602(2015)………..
32
3 Pan XC, Chen XL, Liu HM, Feng YQ, Wei ZX, Zhou YH, Chi ZH, Pi
L, Yen F, Song FQ, Wan XG, Yang ZR, Wang BG, Wang GH, Zhang
YH, Pressure-driven dome-shaped superconductivity and electronic
structural evolution in tungsten ditelluride, Nature Communications
6, 7805(2015)…………………………………………………………...
38
4 Zhang J, Pan Z, Guo FF, Liu WC, Ning HP, Chen YB, Lu MH, Yang B,
Chen J, Zhang ST, Xing XR, Rodel J, Cao WW, Chen YF,
Semiconductor/relaxor 0-3 type composites without thermal
depolarization in Bi0.5Na0.5TiO3-based lead-free piezoceramics, Nature
Communications 6, 6615(2015)……………………………………….
44
5 Xu K, Wang K, Zhao W, Bao WZ, Liu EF, Ren YF, Wang M, Fu YJ,
Zeng JW, Li ZG, Zhou W, Song FQ, Wang XR, Shi Y, Wan XG, Fuhrer
MS, Wang BG, Qiao ZH, Miao F, Xing DY, The positive
piezoconductive effect in grapheme, Nature Communications 6, 8119
(2015)…………………………………………………………………..
54
6 Jiang SW, Liu S, Wang P, Luan ZZ, Tao XD, Ding HF, Wu D,
Exchange-dominated pure spin current transport in Alq(3) molecules,
Physical Review Letters 115, 086601(2015)…………………………
60
7 Nie YF, Di Sante D, Chatterjee S, King PDC, Uchida M, Ciuchi S,
Schlom DG, Shen KM, Formation and observation of a quasi-two-
dimensional d(xy) electron liquid in epitaxially stabilized Sr2-xLaxTiO4
thin films, Physical Review Letters 115, 096405(2015)………………
65
8 Chen L, Yang YR, Gui ZG, Sando D, Bibes M, Meng XK, Bellaiche L,
Large elasto-optic effect in epitaxial PbTiO3 films, Physical Review
Letters 115, 267602(2015)…………………………………………….
70
9 Zhang LJ, Datta A, Walmsley IA, Precision metrology using weak
measurements, Physical Review Letters 114, 210801(2015)…………
76
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National Lab of Solid State Microstructures
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National Lab of Solid State
Microstructures
Nanjing University
Director Yanfeng CHEN
Deputy
Director
Qianghua WANG
Hai SANG
Hui LIU
Jiang YIN
Director of
the Office
Assistant to
the Director
Wenjun ZHANG
Xiping HAO
Jun WU
Address: 22 Hankou Road
Nanjing, China
Zip Code: 210093
Tel: 86-25-83592756
Fax: 86-25-83595535
Email: [email protected]
Web
Address:
http://vlssm.nju.edu.cn
10 He ZQ, Xiong SJ, Wu SY, Zhu XB, Meng M, Wu XL, Strong facet-
induced and light-controlled room-temperature ferromagnetism in
semiconducting beta-FeSi2 nanocubes, Journal of The American
Chemical Society 137, 11419-11424 (2015)…………………………..
81
11 Gong YY, Wang DH, Cao QQ, Liu EK, Liu J, Du YW, Electric field
control of the magnetocaloric effect, Advanced Materials 27, 801-805
(2015)…………………………………………………………………..
87
12 Fan RH, Zhou Y, Ren XP, Peng RW, Jiang SC, Xu DH, Xiong X, Huang
XR, Wang M, Freely tunable broadband polarization rotator for
terahertz waves, Advanced Materials 27, 1201-1206(2015)………….
92
13 Chen TS, Liu WQ, Zheng FB, Gao M, Pan XC, van der Laan, G, Wang
XF, Zhang QF, Song FQ, Wang BG, Wang BL, Xu YB, Wang GH,
Zhang R, High-mobility Sm-doped Bi2Se3 ferromagnetic topological
insulators and robust exchange coupling, Advanced Materials 27,
4823-4829(2015)……………………………………………………….
98
14 Cui Y, Xin R, Yu ZH, Pan YM, Ong ZY, Wei XX, Wang JZ, Nan HY, Ni
ZH, Wu Y, Chen TS, Shi Y, Wang BG, Zhang G, Zhang YW, Wang XR,
High-performance monolayer WS2 field-effect transistors on high-
kappa dielectrics, Advanced Materials 27, 5230-5234(2015)………...
105
2015 年发表论文摘要(Abstract list of publications in 2015)………. 110
I Science and Engineering of Artificial
Microstructures
111
1 Multiferroicity and magnetoelectric coupling in TbMnO3 thin films, Hu
N, Lu CL, Xia ZC, Xiong R, Fang PF, Shi J, Liu JM, ACS Applied
Materials & Interfaces 7, 26603-26607(2015) ……………………….
111
2 Light-induced resistance effect observed in nano Au films covered
two-dimensional colloidal crystals, Liu S, Huang MZ, Yao YJ, Wang H,
Jin KJ, Zhan P, Wang ZL, ACS Applied Materials & Interfaces 7,
19536-19540(2015)……………………………………………………
111
3 Magnetism-driven ferroelectricity in double perovskite Y2NiMnO6, Su J,
Yang ZZ, Lu XM, Zhang JT, Gu L, Lu CJ, Li QC, Liu JM, Zhu JS, ACS
Applied Materials & Interfaces 7, 13260-13265(2015)……………...
111
4 Superior optical properties of perovskite nanocrystals as single photon
emitters, Hu FR, Zhang HC, Sun C, Yin CY, Lv BH, Zhang CF, Yu
WW, Wang XY, Zhang Y, Xiao M, ACS Nano 9, 12410-12416(2015)..
112
5 A universal law for plasmon resonance shift in biosensing, Zhang WH,
Martin OJF, ACS Photonics 2, 144-150(2015)………………………..
112
6 Strong phonon-plasmon coupling at the interface of 3C-SiC/metal
oxide nanoparticles, Xu JQ, Xiong SJ, Wu XL, Liu LZ, Li TH, Chu PK,
Acta Materialia 83, 113-119(2015)…………………………………...
112
7 Size dependence and associated formation mechanism of multiple-fold
annealing twins in nanocrystalline Cu, Cao ZH, Xu LJ, Sun W, Shi J,
Wei MZ, Pan GJ, Yang XB, Zhao JW, Meng XK, Acta Materialia 95,
312-323(2015)………………………………………………………….
113
8 Rydberg-atom-based electrometry, Huang W, Liang ZT, Du YX, Yan H,
Zhu SL, Acta Physica Sinica 64, 160702(2015)……………………..
113
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Annual Report 2015——Content
iii
9 Exploring multiferroic materials based on artificial superlattice LaFeO3-YMnO3 and natural superlattice n-LaFeO3-
Bi4Ti3O12 thin films, Chen YB, Zhang F, Zhang LY, Zhou J, Zhang ST, Chen YF, Acta Physica Sinica 64, 097502
(2015)……………………………………………………………………………………………………………………
113
10 Plasmonic propagation and spectral splitting in nanostructured metal wires, Xu DH, Hu Q, Peng RW, Zhou Y, Wang
M, Acta Physica Sinica 64, 097803(2015)…………………………………………………………………………….
114
11 Ultrafast spectroscopic study for singlet fission, Zhang B, Zhang CF, Li XY, Wang R, Xiao M, Acta Physica Sinica
64, 094210(2015)………………………………………………………………………………………………………..
114
12 Tuning the photoluminescence, magnetism and cytotoxicity of ZnO by tailoring the nanostructures, Zhang JH, Han JG,
Acta Physica Sinica 64, 097702(2015)…………………………………………………………………………………
115
13 Finite element simulation on the mechanical properties of microcellular polyurethane elastomers, Chen QY, Ding
MM, Huang YN, Jia YX, Shi TF, Acta Polymerica Sinica 10, 1231-1234(2015)…………………………………….
115
14 Controlling resistance switching polarities of epitaxial BaTiO3 films by mediation of ferroelectricity and oxygen
vacancies, Li M, Zhou J, Jing XS, Zeng M, Wu SJ, Gao JW, Zhang Z, Gao XS, Lu XB, Liu JM, Alexe M, Advanced
Electronic Materials 1, 1500069(2015)………………………………………………………………………………..
116
15 Freely tunable broadband polarization rotator for terahertz waves, Fan RH, Zhou Y, Ren XP, Peng RW, Jiang SC, Xu
DH, Xiong X, Huang XR, Wang M, Advanced Materials 27, 1201-1206(2015)……………………………………..
116
16 Resistive switching characteristics in TiO2/LaAlO3 heterostructures sandwiched in Pt electrodes, Cao YY, Di QT, Zhu
L, Li AD, Wu D, Advances in Materials Science and Engineering 470107(2015)………………………………….
116
17 Deposition-parameter-determined resistive switching characteristics in TiOx/Pb(Zr0.52Ti0.48)O-3 bilayers, Zhou XY,
Luo Y, Li AD, Wu D, Advances in Materials Science and Engineering 871825(2015)……………………………..
117
18 The flexoelectric effect associated size dependent pyroelectricity in solid dielectrics, Bai G, Liu ZG, Xie QY, Guo YY,
Li W, Yan XB, AIP Advances 5, 097117(2015)………………………………………………………………………..
117
19 External field effects on aging phenomenon of acceptor-doped BaTiO3 ceramics, Guo YY, Liu JM, Guo YF, Wei T,
Guo YJ, Zhang N, AIP Advances 5, 097107(2015)……………………………………………………………………
117
20 Resonant transmission and mode modulation of acoustic waves in H-shaped metallic gratings, Deng YQ, Qi DX, Fan
RH, Zhang K, Peng RW, AIP Advances 5, 047148(2015)……………………………………………………………..
117
21 3C-SiC/ZnS heterostructured nanospheres with high photocatalytic activity and enhancement mechanism, Zhang J,
Wu XL, Liu LZ, Yang L, Gan ZX, Chu PK, AIP Advances 5, 037120(2015)…………………………………………
118
22 Large optical nonlinearity induced by singlet fission in pentacene films, Liu YL, Zhang CF, Wang R, Zhang B, Tan
ZN, Wang XY, Xiao M, Angewandte Chemie-International Edition 54, 6222-6226(2015)…………………………
118
23 Making structured metals transparent for ultrabroadband electromagnetic waves and acoustic waves, Fan RH, Peng
RW, Huang XR, Wang M, Annals of Physics 358, 5-19(2015)………………………………………………………..
118
24 Some topological states in one-dimensional cold atomic systems, Mei F, Zhang DW, Zhu SL, Annals of Physics 358,
58-82(2015)……………………………………………………………………………………………………………..
119
25 Lateral carrier confinement in InGaN quantum-well nanorods, Shi CT, Zhang CF, Wang XY, Xiao M, Annals of
Physics 358, 255-265(2015)…………………………………………………………………………………………….
119
26 Control the polarization state of light with symmetry-broken metallic metastructures, Xiong X, Jiang SC, Hu YS, Hu
YH, Wang ZH, Peng RW, Wang M, Annals of Physics 358, 129-158(2015)…………………………………………..
119
27 Tunable surface and/or interface ferromagnetism of ZnO nanoparticles, Zhang JH, Yu LW, Song Q, Du YW, Annals
of Physics 358, 159-171(2015)…………………………………………………………………………………………
119
28 Electronic states and phonon properties of GexSi1-x nano structures, Zhao PQ, Liu LZ, Yang YM, Wu XL, Annals of
Physics 358, 20-57(2015)……………………………………………………………………………………………….
120
29 Constrained growth of ultrasmall BiOCl nanodiscs with a low percentage of exposed {001} facets and their enhanced
photoreactivity under visible light irradiation, Chang XF, Wang SB, Qi Q, Gondal MA, Rashid SG, Yang DY,
Dastageer MA, Shen K, Xu QY, Wang P, Applied Catalysis B-Environmental 176, 201-211(2015)………………..
120
30 Down-conversion luminescence and its temperature-sensing properties from Er3+-doped sodium bismuth titanate
ferroelectric thin films, Wang SS, Zheng SS, Zhou H, Pan AL, Wu GH, Liu JM, Applied Physics A-Materials
Science & Processing 121, 773-777(2015)…………………………………………………………………………….
120
31 Enhanced near-band-edge emission from a-plane ZnO thin films on SrTiO3 substrates, Wu GH, Li X, Liu MF, Yan ZB,
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8M&field=AU&value=Xu,%20DHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Xiong,%20Xhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Huang,%20XRhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wang,%20M&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Cao,%20YYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Di,%20QThttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zhu,%20Lhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zhu,%20Lhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Li,%20ADhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wu,%20Dhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zhou,%20XYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Luo,%20Yhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Li,%20ADhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wu,%20D&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Deng,%20YQhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Qi,%20DXhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Fan,%20RHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Fan,%20RHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zhang,%20Khttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Peng,%20RW&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zhang,%20Jhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wu,%20XLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Liu,%20LZhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Yang,%20Lhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&author_name=Gan,%20ZX&dais_id=16609102&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&author_name=Chu,%20PK&dais_id=16303461&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Liu,%20YLhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&author_name=Zhang,%20CF&dais_id=16321411&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wang,%20Rhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zhang,%20Bhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Tan,%20ZNhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Tan,%20ZNhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wang,%20XYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Xiao,%20M&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Fan,%20RHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Peng,%20RWhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Peng,%20RWhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Huang,%20XRhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Wang,%20M&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Mei,%20Fhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Zhang,%20DWhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Zhu,%20SL&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Shi,%20CThttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Zhang,%20CFhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Wang,%20XYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Xiao,%20M&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Xiong,%20Xhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Jiang,%20SChttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Hu,%20YShttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Hu,%20YHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CjEBfrYH5XlXCTNWuH&field=AU&value=Hu,%20YHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=Exclu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National Lab of Solid State Microstructures
iv
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32 Improvement of surface-enhanced Raman scattering by dipolar resonance mode of silver half-shell array, Du W, Yan
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34 Tunable Dirac points and perfect transmission in asymmetric graphene superlattices, Zhang RL, Li JJ, Zhou Y, Peng
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35 Multiple copies of orbital angular momentum states through second-harmonic generation in a two-dimensional
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36 Experimental observation of sharp cavity plasmon resonances in dielectric-metal core-shell resonators, Gu P, Wan
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37 Enhanced electromechanical properties and phase transition temperatures in [001] textured Pb(In1/2Nb1/2)O-3-
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38 Tunable photoluminescence from sheet-like black phosphorus crystal by electrochemical oxidation, Gan ZX, Sun LL,
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39 Induction and control of room-temperature ferromagnetism in dilute Fe-doped SrTiO3 ceramics, He J, Lu XM, Zhu
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40 Enhancement of magnetism by structural phase transition in MoS2, Yan SM, Qiao W, He XM, Guo XB, Xi L, Zhong
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41 Quantum confinement effects across two-dimensional planes in MoS2 quantum dots, Gan ZX, Liu LZ, Wu HY, Hao
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42 Bi0.5Na0.5TiO3:ZnO lead-free piezoelectric composites with deferred thermal depolarization, Zhang J, Pan Z, Nie PX,
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43 Anomalous crack arrays in anisotropic-strained manganite on scandate substrates, Ju CC, Xue F, Huang FZ, Chen
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44 Acoustic phase-reconstruction near the Dirac point of a triangular phononic crystal, Yu SY, Wang Q, Zheng LY, He C,
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45 Charged two-exciton emission from a single semiconductor nanocrystal, Hu FR, Zhang Q, Zhang CF, Wang XY, Xiao
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46 Electronic structure and magnetism in g-C4N3 controlled by strain engineering, Liu LZ, Wu XL, Liu XX, Chu PK,
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47 Nonvolatile data storage using mechanical force-induced polarization switching in ferroelectric polymer, Chen X,
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48 Broadband enhanced transmission of acoustic waves through serrated metal gratings, Qi DX, Deng YQ, Xu DH, Fan
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49 Achieving high strength and high electrical conductivity in Ag/Cu multilayers, Wei MZ, Xu LJ, Shi J, Pan GJ, Cao ZH,
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50 Luminescent monolayer MoS2 quantum dots produced by multi-exfoliation based on lithium intercalation, Qiao W,
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51 Strain-induced band structure and mobility modulation in graphitic blue phosphorus, Liu LZ, Wu XL, Liu XX, Chu
PK, Applied Surface Science 356, 626-630(2015)……………………………………………………………………..
126
52 Structural and chemical characterization of novel NixZn1-xGa2O4 nanocatalysts at atomic resolution, Xu Q, Wu ZC,
Hong JH, Chang XF, Li XJ, Yan SC, Wang P, Applied Surface Science 353, 419-424(2015)………………………..
126
53 Facile method to prepare CdS nanostructure based on the CdTe films, Ma LG, Chen YH, Wei ZL, Cai HL, Zhang FM,
Wu XS, Applied Surface Science 349, 740-745(2015)………………………………………………………………..
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54 Facet-controlled synthesis and facet-dependent photocatalytic properties of SnO2 micropolyhedrons, Zhou GX, Wu
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ode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Hao,%20YLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Hao,%20YLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Shan,%20Yhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Wu,%20XLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Chu,%20PK&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Zhang,%20Jhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Pan,%20Zhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Nie,%20PXhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Cui,%20YShttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Yang,%20Bhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Chen,%20Jhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4FT9zA52yTEpeZYvpvI&field=AU&value=Zhang,%20SThttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Ju,%20CChttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Xue,%20Fhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Huang,%20FZhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Chen,%20LQhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Chen,%20LQhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Lu,%20XMhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zhu,%20JShttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Jensen,%20HM&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Yu,%20SYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wang,%20Qhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zheng,%20LYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=He,%20Chttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Liu,%20XPhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Lu,%20MHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Chen,%20YF&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Hu,%20FRhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Zhang,%20Qhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&author_name=Zhang,%20CF&dais_id=16321411&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wang,%20XYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Xiao,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Xiao,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Liu,%20LZhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Wu,%20XLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&field=AU&value=Liu,%20XXhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=X2LZVODyN5uLLY6mI8M&author_name=Chu,%20PK&dais_id=16303461&excludeEventConfig=ExcludeIfFromFullRecPage&cacheurlFromRightClick=nohttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Chen,%20Xhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Tang,%20Xhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Chen,%20XZhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Chen,%20YLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Guo,%20Xhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Ge,%20HXhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Shen,%20QDhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Qi,%20DXhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Deng,%20YQhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Xu,%20DHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Fan,%20RHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Fan,%20RHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Peng,%20RWhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Chen,%20ZGhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Lu,%20MHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Huang,%20XRhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Wang,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Wei,%20MZhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Xu,%20LJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Shi,%20Jhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Pan,%20GJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&field=AU&value=Cao,%20ZHhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=W2ZMBDiP3RlEdQ7EuIZ&author_name=Meng,%20XK&dais_id=16133846&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2E6Ut6kBT2pNINHAvhF&field=AU&value=Qiao,%20Whttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2E6Ut6kBT2pNINHAvhF&field=AU&value=Yan,%20SMhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2E6Ut6kBT2pNINHAvhF&field=AU&value=Song,%20XYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2E6Ut6kBT2pNINHAvhF&field=AU&value=Zhang,%20Xhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2E6Ut6kBT2pNINHAvhF&field=AU&value=He,%20XMhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2E6Ut6kBT2pNINHAvhF&field=AU&value=Zhong,%20Whttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2E6Ut6kBT2pNINHAvhF&field=AU&value=Du,%20YW
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Annual Report 2015——Content
v
XL, Liu LZ, Zhu XB, Zhu XS, Hao YL, Chu PK, Applied Surface Science 349, 798-804(2015)……………………... 127
55 Correlation of the 755-778 cm(-1) Raman mode with oxygen vacancies in tin oxide nanostructures, Liu LZ, Wu XL, Li
TH, Shen JC, Applied Surface Science 347, 265-268(2015)…………………………………………………………..
127
56 Electronic and magnetic properties of MoS2 nanoribbons with sulfur line vacancy defects, Han Y, Zhou J, Dong JM,
Applied Surface Science 346, 470-476(2015)…………………………………………………………………………
128
57 Amorphous nickel/cobalt tungsten sulfide electrocatalysts for high-efficiency hydrogen evolution reaction, Yang L,
Wu XL, Zhu XS, He CY, Meng M, Gan ZX, Chu PK, Applied Surface Science 341, 149-156(2015)……………….
128
58 Enhanced corrosion protective PANI-PAA/PEI multilayer composite coatings for 316SS by spin coating technique,
Syed JA, Lu HB, Tang SC, Meng XK, Applied Surface Science 325, 160-169(2015)………………………………..
128
59 Dielectric relaxation characteristics of chemically reduced graphite oxide, Wei GD, Yu J,Gu M, Ai XQ, Xu XB, Tang
TB, Carbon 95, 374-379(2015)…………………………………………………………………………………………
129
60 Multiferroic and dielectric properties of Bi4LaTi3FeO15 ceramics, Ti RX, Huang FZ, Zhu WL, He J, Xu TT, Yue C,
Zhao J, Lu XM, Zhu JS, Ceramics International 41, S453-S457(2015)………………………………………………
129
61 Influences of topological chain structures to the crystallization of block copolymers, Zhang LL, Chen QY, Zhou HW,
Shi TF, Huang YN, Chemical Journal of Chinese Universities-Chinese 36, 1832-1837(2015)……………………..
129
62 Ferroelectric and piezoelectric properties of Ba(Ti0.89Sn0.11)O-3 thin films prepared by sol-gel method, Zhu ZW, Guo
XL, Wang ZM, Yuan GL, Wang YP, Cai ZL, Chen LF, Chen J, Zhang Y, Liu ZG, Chemical Physics Letters 638,
168-172(2015)…………………………………………………………………………………………………………...
129
63 Polarization-dependent raman spectroscopy of epitaxial TiO2(B) thin films, Jokisaari JR, Bayerl D, Zhang K, Xie L,
Nie YF, Schlom DG, Kioupakis E, Graham GW, Pan XQ, Chemistry of Materials 27, 7896-7902(2015)……………
130
64 Structure, morphology, and magnetic properties of high-performance NiCuZn ferrite, He XM, Yan SM, Li ZW, Zhang
X, Song XY, Qiao W, Zhong W, Du YW, Chinese Physics B 24, 127502(2015)………………………………………
130
65 Temperature dependences of ferroelectricity and resistive switching behavior of epitaxial BiFeO3 thin films, Lu ZX,
Song X, Zhao LN, Li ZW, Lin YB, Zeng M, Zhang Z, Lu XB, Wu SJ, Gao XS, Yan ZB, Liu JM, Chinese Physics B
24, 107705(2015)………………………………………………………………………………………………………..
130
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67 Dynamic resistive switching in a three-terminal device based on phase separated manganites, Wang ZQ, Yan ZB, Qin
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68 Electric-field tunability of dielectric in polycrystalline Sr1-xMnxTiO3 thin films, Hou YY, He J, Xu TT, Xiao SY, Lu XL,
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70 The 90 degrees domain splitting and electromechanical behaviors in ferroelectric thin films with triangle anti-dot
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