Presentations EBSD

73
The Business of Science ® Page 1 © Oxford Instruments 2015 Jenny Goulden Oxford Instruments Recent Developments in EBSD

Transcript of Presentations EBSD

Page 1: Presentations EBSD

The Business of Science®

Page 1 © Oxford Instruments 2015

Jenny Goulden

Oxford Instruments Recent Developments in EBSD

Page 2: Presentations EBSD

The Business of Science®

Page 2 © Oxford Instruments 2015

• Product Updates: • 10:15-10:45 EBSD developments :

• Hardware, basic Aztec, ease of use, indexing, mapping, Synergy

• 10:50-11.30 Advanced functions: • Large area mapping, refined accuracy, updates to post processing

• More application specific talks later

Agenda

Page 3: Presentations EBSD

The Business of Science®

Page 3 © Oxford Instruments 2015

Introduction • Developments driven by market / application requirements

• What are the challenges • Which solutions work / don’t work • How can we help?

• Market requirements

• Improved spatial resolution EBSD (lower kV & beam current) • Faster data acquisition (reduce SEM time, more data, better

statistics) • Improvements to data acquisition • Improvements to EDS integration • Easier to acquire better quality data

Page 4: Presentations EBSD

The Business of Science®

Page 4 © Oxford Instruments 2015

Introduction

• Result number of development • Detector developments

• Improve sensitivity • Improve speed

• AZtec platform launched 2011

• Updates about every 6 months • Brief overview of product • Key features and functions

Page 5: Presentations EBSD

Page 5 © Oxford Instruments 2015

The Business of Science®

• NordlysNano

• Better sensitivity

• Improved spatial resolution

• NordlysMax2

• Faster acquisition speed

• Retain sensitivity

• Forescattered Detectors

• Better orientation imaging

EBSD Hardware Developments

Page 6: Presentations EBSD

The Business of Science®

Page 6 © Oxford Instruments 2015

Detector Developments - NordlysNano

• EBSD detector with HIGHER sensitivity

– Designed to for the requirements of ‘nano scale’ applications

• Developed in direct response to customer requests

– To work at low kV

– To work at low beam current

– Best spatial resolution

– Highest quality patterns (high pixel count)

Page 7: Presentations EBSD

The Business of Science®

Page 7 © Oxford Instruments 2015

Higher Spatial Resolution

20kV Iron Pyrite 5kV Iron Pyrite

• The challenge for improving spatial resolution is operation at low kV

• Low signal • Weaker patterns especially at edges • Broader Bands

• Requires optimisation the signal to the sensor

Page 8: Presentations EBSD

The Business of Science®

Page 8 © Oxford Instruments 2015

NorldysNano

• Delivers the best possible sensitivity while accurately imaging the EBSP

• 60% more sensitive than older EBSD detectors

• Sensitivity is directly related to quantum efficiency of the CCD coupled with the detector optics

– NordlysNano has 70% Quantum efficiency

– Coupled with bespoke optics specifically optimised to work with our CCD

• Eliminates distortion from the pattern (zero barrel distortion)

– Barrel distortion present in all optics

Page 9: Presentations EBSD

The Business of Science®

Page 9 © Oxford Instruments 2015

Barrel Distortion Removal:

Old lens ~2% distortion New lens <0.5% distortion

• Best pattern quality: important in applications looking at pattern detail or subtle differences in EBSPs • For example cross correlation techniques

Page 10: Presentations EBSD

The Business of Science®

Page 10 © Oxford Instruments 2015

NordlysNano

• Capability to work at lower beam energies, important for:

• Nano materials where low kV offers better spatial resolution

• Beam sensitive samples, where higher beam energies damage the samples

• Insulators, where lower kV can remove the need to coat the sample

• Excellent for TKD

Page 11: Presentations EBSD

The Business of Science®

Page 11 © Oxford Instruments 2015

NordlysNano

• 5kV Ni 0.5um grain size 100Hz • Aluminia Insulator

• Alumina – NO coating

• Hit Rate 85% (porous sample) at 90Hz

10kV

5kV

Page 12: Presentations EBSD

The Business of Science®

Page 12 © Oxford Instruments 2015

NordlysNano

• Transmission Kikuchi Diffraction

• Cu15B-strained-4nm-IPF-Z

• This is a strained nanocrystalline copper

• IPF-Z direction, high angle boundaries in black and CSL boundaries in colour. Step size 4nm.

Acknowledgement: Saritha Samudrala (University of Sydney) and Kevin Hemker (Johns Hopkins University)

Page 13: Presentations EBSD

The Business of Science®

Page 13 © Oxford Instruments 2015

Sensitivity vs High Resolution

• Target to deliver both high sensitivity and high resolution

• NordlysNano matches customised optics and CCD

• Without this optical design full resolution of megapixel CCDs cannot be achieved

– High resolution images not simply a matter of more pixels in the pattern

• Important in applications looking at pattern detail or subtle differences in EBSPs

• e.g Cross correlation techniques

Page 14: Presentations EBSD

Page 14 © Oxford Instruments 2015

The Business of Science®

Faster Data Acquisition

• SEM time becoming more valuable / expensive

• Challenged with more efficient use of SEM time

• Collect more data / better statistics

• Traditionally with EBSD faster data collection has required higher beam current up to maximum speed

• Challenge was to develop hardware which could operate:

• Faster maximum speed

• Fast acquisition at lower beam energy

• Operate at lower kV and beam current

Page 15: Presentations EBSD

Page 15 © Oxford Instruments 2015

The Business of Science®

Nordlys Max2 Detector

• 30% faster, with better sensitivity

• Fastest speed 870Hz (or patterns per second)

• 870Hz at 5nA - acquire and solve in real time

• 870Hz with simultaneous EDS data - acquire and solve

• Operation at 5kV

• Operation at lower beam current (100pA)

• Achieved by improving CCD

Page 16: Presentations EBSD

Page 16 © Oxford Instruments 2015

The Business of Science®

NordlysMax2

• 870Hz • 99% indexed • 12nA

Ni sample

• Simultaneous EBSD & EDS

• Tungsten heavy alloy • 870pps • Real time sample

characterisation

100um

Ni X-ray Map

W X-ray Map

Phase Map

Page 17: Presentations EBSD

Page 17 © Oxford Instruments 2015

The Business of Science®

NordlysMax2 Low kV EBSD Patterns

20kV

5kV

5kV

• Patterns from tungsten • 20kV • 5kV • But still able to solve

Page 18: Presentations EBSD

Page 18 © Oxford Instruments 2015

The Business of Science®

• In-situ experiments are performed in the SEM chamber • Monitor change while ‘experimenting’ on the sample • Typically heating and/or tensile testing • Specialised stages are used in conjunction with EBSD

• Increasingly used to study and understand solid state events:

• Microstructure development • Recrystallisation and recovery • Failure analysis • Phase transformations and phase relationships

(Keith will talk about this later)

• Detector hardware is also important

EBSD – Dynamic Studies

Page 19: Presentations EBSD

Page 19 © Oxford Instruments 2015

The Business of Science®

• NordlysMax2 has an integrated a IR filter • High sensitivity compared to conventional high temperature

phosphor screens

NordlysMax2 – Dynamic Studies

EBSP from Ti Transformation at 882°C from alpha to beta phase

Page 20: Presentations EBSD

Page 20 © Oxford Instruments 2015

The Business of Science®

In Situ Heating Example: Low C steel 895oC 6 mins 880oC 945oC 895oC 0 mins

austenite ferrite

GATAN Heating stage

Page 21: Presentations EBSD

Page 21 © Oxford Instruments 2015

The Business of Science®

• Nordlys EBSD detectors can have up to 6 diodes positioned around the phosphor

• Top – atomic number(Z) contrast images

• Lower - orientation contrast

• Side – mixed images

• FSD images useful for imaging a well prepared tilted sample (as in EBSD)

• These diodes are controlled independently within the Aztec platform

Forescatter Detector Imaging

Page 22: Presentations EBSD

Page 22 © Oxford Instruments 2015

The Business of Science®

Forescatter Detector Control

• Up to 6 individual images can be acquired • Settings are controlled within the AZtec interface – both

manual and auto settings are available • Automatic optimisation means easy to collect excellent images • Default Z contrast or Orientation contrast settings • Or customise settings • Up to 6 individual images can be

mixed

Page 23: Presentations EBSD

Page 23 © Oxford Instruments 2015

The Business of Science®

Automatic Image Optimisation

This automatic beam optimisation is capable of collecting images under a full range of beam current and kV.

20kV 10nA 20kV 5nA 20kV 0.5nA

Page 24: Presentations EBSD

Page 24 © Oxford Instruments 2015

The Business of Science®

• How Aztec helps in getting better data – with ease

• Improved Indexing

• Distinguishing similar crystal structures

• High Angular Accuracy

• EDS Integration

• Analysis Tools

• Point & Linescan

• Line Large Area Mapping

• TKD

• Post Processing

AZtec Platform Developments

Page 25: Presentations EBSD

Page 25 © Oxford Instruments 2015

The Business of Science®

Collecting Good EBSD Data.....

• Takes time and expertise: several variables will impact the result:

• Pattern quality: Background, exposure time, SEM conditions

• System Calibration: Detector position, working distance

• Band detection & Indexing: Manual band selection, choice of bands and reflectors

• The impact if ‘wrong’

• Lower hit rate, poor phase discrimination, etc...

• So there are number of improvements to EBSD acquisition with AZtec

Page 26: Presentations EBSD

Page 26 © Oxford Instruments 2015

The Business of Science®

Pattern Quality – Background Correction

• Signal across raw EBSD pattern is ‘steep’

• Typically static background collection required

• Scan speed, grain size, kV, phase (different Z), and magnification

• Potential negative impact on indexing success

• New dynamic background correction implemented in AZtec

• Compensates as conditions change

• Pattern by pattern contrast optimisation

• Works where static background was inadequate

Raw EBSP

Background corrected

Page 27: Presentations EBSD

Page 27 © Oxford Instruments 2015

The Business of Science®

AutoExposure

• Optimises signal strength to avoid under or over exposure of the camera

• Optimum exposure time calculated for given binning and gain

• Uses ‘Signal Strength’ to optimise the pattern signal : noise

Page 28: Presentations EBSD

Page 28 © Oxford Instruments 2015

The Business of Science®

System Calibration

• Accurate indexing requires an accurate calibration of the pattern centre

• Dependant on the geometry of acquisition (i.e. WD & DD)

• Refinement is required when conditions/ sample change

• Historically extracted from a single pattern • Using AZtec system is always calibrated

• Collect data at a full range of WD & DD without refinement

20mm wd 15mm wd 10mm wd

Page 29: Presentations EBSD

Page 29 © Oxford Instruments 2015

The Business of Science®

Plagioclase, Typical mapping quality pattern

Weighted band (Hough peak) selection

• Bands chosen preferentially by length as well as intensity • Generally improves “fit” between detected & actual bands • Allows greater numbers of bands detected in routine use • Improved performance for low density materials demanding a

higher numbers of detected bands (e.g. low symmetry phases)

Page 30: Presentations EBSD

Page 30 © Oxford Instruments 2015

The Business of Science®

Example pattern: Low-density silicate mineral at typical mapping speed

Non-weighted band detection Weighted band detection

Band selection comparison

Page 31: Presentations EBSD

Page 31 © Oxford Instruments 2015

The Business of Science®

Aztec “Class” indexing

• Allows effective use of larger numbers of detected bands

• Fewer non-solutions and indexing mistakes

• Robust indexing on challenging phases

• Improves ease of use (# bands no longer critical setting)

• Better accommodates overlapping patterns, e.g. at grain boundaries

• Solution from dominant group of bands (from one side) generally supersedes any mistaken four-band combinations which include representatives from either side

Page 32: Presentations EBSD

Page 32 © Oxford Instruments 2015

The Business of Science®

Steel

AZtec“Class” indexing

Improved indexing for overlapping patterns

“Class” indexing All-band indexing

Page 33: Presentations EBSD

Page 33 © Oxford Instruments 2015

The Business of Science®

Aztec“Class” indexing

Improved indexing for phase discrimination

Traditional indexing method “Class” indexing method

Gabbro

Page 34: Presentations EBSD

Page 34 © Oxford Instruments 2015

The Business of Science®

AZtec“Class” indexing

Improved indexing % for challenging phases

Traditional indexing method “Class” indexing method

Gabbro

Page 35: Presentations EBSD

Page 35 © Oxford Instruments 2015

The Business of Science®

Traditional Indexing Challenges – No of bands

• Duplex steel sample: four phases; Iron FCC, Iron BCC, Sigma & Chi

12 bands

• Too many bands selected

8 bands

• Too few bands selected

Page 36: Presentations EBSD

Page 36 © Oxford Instruments 2015

The Business of Science®

New AZtec Indexing

• No misindexing • No patches with no solution • Grain boundary minimised

12 bands

8 bands

• Higher accurate hit rates • Indexing is less sensitive

to user defined settings • Same result 8 or 12

bands • Analysis more robust

Page 37: Presentations EBSD

Page 37 © Oxford Instruments 2015

The Business of Science®

Discrimination of Similar Crystal Structures • Differentiation of two phases with closely related structures and

slightly different unit cell sizes

• Pt & Ni weld from the central electrode tip of a spark plug

• Pt and Ni same crystal structure

• 9-10% difference in lattice parameter Pt Ni

cubic cubic

fcc fcc

3.924 3.52-3.57

space

group=225

space group

=225

Conventional indexing cannot distinguish between the two phases

Ni Pt

Page 38: Presentations EBSD

Page 38 © Oxford Instruments 2015

The Business of Science®

Accurate Phase Discrimination

• Sorting solutions based on differences in band width to see detail of the two separate phases and the mixed region in the weld

Ni Map

Pt Map

Page 39: Presentations EBSD

Page 39 © Oxford Instruments 2015

The Business of Science®

Discrimination of Similar Crystal Structures - TruPhase

• This function is applicable on integrated EBSD/ EDS systems • Applies the EDS signal collected in Real Time, simultaneously

with EBSD to assist in distinguishing phases with similar crystal structure but different chemistry

• Then re ranks EBSD solutions, but does not overrule the EBSD • Where there is more than one viable phase identified

through indexing alone the EDS is used to weight the results

Page 40: Presentations EBSD

Page 40 © Oxford Instruments 2015

The Business of Science®

Discrimination of Similar Crystal Structures - TruPhase

• TruPhase applies the full X-ray spectrum profile not specific ‘windows integrals’

• Therefore it is robust to issues such as changes in background intensity, peak overlaps and peak pile up

• By applying the ‘spectrum profile’ it does not rely on automatic peak identification

• Reliable operation during Fast Mapping – when the X-ray spectra is likely to contain less statistics

• Can be applied in real time as data acquired or within re analysis

Page 41: Presentations EBSD

Page 41 © Oxford Instruments 2015

The Business of Science®

FSD mixed image

Application Example - Differentiating Cu & Ni:

Phase map

Cu

Ni Hough based

indexing

Phase map

Tru-

Phase

Ni Kα1

Cu Kα1

Cu Ni

Cubic high Cubic high

a=3.61 a=3.57

b=3.61 b=3.57

c=3.61 c=3.57

Page 42: Presentations EBSD

Page 42 © Oxford Instruments 2015

The Business of Science®

TruPhase Example Biotite and Muscovite

Fe map Al map

Na map

Biotite distribution

Muscovite distribution Albite distribution

Page 43: Presentations EBSD

Page 43 © Oxford Instruments 2015

The Business of Science®

• Normal EBSD map

• Similarity between muscovite and biotite makes it difficult to differentiate the two phases resulting in the speckly solving in the muscovite phase

• Reanalaysed using TruPhase

• Better differentiation of the two phases, which corresponds to the element distribution seen in the X-ray maps

TruPhase Example Biotite and Muscovite

Page 44: Presentations EBSD

Page 44 © Oxford Instruments 2015

The Business of Science®

• High Orientation Accuracy

• Refined Accuracy

• EDS Integration

• Point & Linescan

• Large Area Mapping

• TKD

More Advanced Functions

Page 45: Presentations EBSD

Page 45 © Oxford Instruments 2015

The Business of Science®

• Many factors influence EBSD accuracy (including pattern resolution, CCD pixels, acquisition conditions, Hough resolution and band detection)

• Aztec Refined Accuracy improves the accuracy of band detection • Delivering more

accurate orientation measurement

Example shows Ni EBSP Traditional Hough based band

detection

Refined Accuracy Mode

Traditional band detection is good Refined accuracy is better

High Orientation Accuracy Mode

Page 46: Presentations EBSD

Page 46 © Oxford Instruments 2015

The Business of Science®

• Primary band detection Apply fast, low resolution Hough to detect a set of 2D bands. High Hough resolution is used to increase angular resolution. Through PC and DD convert these to 3D plane normal vectors.

• Indexing From the 3D inter-planar angles, identify all or a subset of the detected bands as crystallographic lattice planes.

• Secondary band detection (only in AZtec Refined Accuracy) Indexing determines the Bragg angle and thereby the band width. With this information, refine the band positions in the EBSP, and utilize the curvature of the Kikuchi bands.

• Form the crystal orientation Calculate the crystal orientation relative to the EBSD detector.

Refined Accuracy

Page 47: Presentations EBSD

Page 47 © Oxford Instruments 2015

The Business of Science®

• Refined Accuracy provides :

• Higher angular accuracy of orientation measurement

• Smaller spread of data, better standard deviation

• Better fit pattern & solution

Refined Accuracy

Page 48: Presentations EBSD

Page 48 © Oxford Instruments 2015

The Business of Science®

Integration of EDS & EBSD

• Collect and view all data simultaneously

• Apply full data cube to further interrogate the sample

• Phase ID

• Identify additional / unexpected phases

• Re-analyse if required

• How accurate is EDS data at high tilt?

Page 49: Presentations EBSD

Page 49 © Oxford Instruments 2015

The Business of Science®

Accurate Integration of EDS & EBSD

• Variation in the specimen/ beam interaction causes changes in spectrum background & peak shape– compared to flat samples

• AZtec X-ray mapping uses a FLS filtering used for background removal

• This is tolerant to changes in background shape

• So we can collect accurate X-ray and EBSD maps at tilt

• But what about quant?

Pt Map

Spectra from XPE16 alloy

collected at 0° (solid) and 70° tilt

(red line ).

Wt % Al Si Ti Cr Fe Ni Mo Total

XPE16 - Flat 1.23 0.18 1.36 17.55 33.51 42.40 3.58 99.80

XPE16 - Tilted 70 deg 1.16 0.19 1.16 17.78 34.01 42.94 3.53 100.79

• Processed using AZtec: standardless, unnormalised quant routines with XPP matrix correction (Pouchou et al.)

• Comparable result at high tilt & on flat samples:

Page 50: Presentations EBSD

Page 50 © Oxford Instruments 2015

The Business of Science®

• Collect spectrum & pattern simultaneously

• Multiple EBSP & spectra can be collected

• Metal valve used in power engines – matrix is steel, multiple secondary phase

• AutoID & quantify spectrum (or select elements manually).

• Based on composition the selected data bases are searched.

• Possible candidate phases listed.

• EBSP is searched against the candidate phases

• View pattern with solution overlay to see fit

Phase Identification

Page 51: Presentations EBSD

Page 51 © Oxford Instruments 2015

The Business of Science®

Phase Identification EDS & EBSD

• Gneiss sample • Phases visible

on BSE image • Collect spectra

from 3 phases: quartz, plagioclase & orthoclase

• Select from Am. Min database

• Collect patterns • Collect phase

map

Page 52: Presentations EBSD

Page 52 © Oxford Instruments 2015

The Business of Science®

Phase ID & Re-Analysis

• High temperature steel sample mapped

• Secondary phase not expected

• Therefore no solution

• Investigate the map data –extract pattern & spectrum

• Identify phases using Phase ID tool

• Two additional phases identified

• Additional phases added to phase list

• Data reanalysed offline to complete map

Page 53: Presentations EBSD

Page 53 © Oxford Instruments 2015

The Business of Science®

Point Analysis

• EBSD Point Analysis

• Collect EBSPs and measure the orientation at a series of points

• Tabulate misorientaion between the each point and a reference

Example

shows a

nanowire

Page 54: Presentations EBSD

Page 54 © Oxford Instruments 2015

The Business of Science®

Linescan

• EBSD (& EDS) Linescan

• Define a line in either x or y direction, collect EBSPs at defined step size or based on number of points

• Plot misorientation profile through the line

• Review phase, MAD etc over the line

• Select point on profile and highlight in table

Page 55: Presentations EBSD

Page 55 © Oxford Instruments 2015

The Business of Science®

AZtec Large Area Mapping

• Unattended collection of high resolution electron images, EBSD and EDS maps from large specimen areas:

• Micro- and Nano- scale from a single data set • Analysis coarse grained material • Statistically valid analysis

2 cm

Page 56: Presentations EBSD

Page 56 © Oxford Instruments 2015

The Business of Science®

How it Works

• Collect and montage (EBSD & EDS) data at high resolution and analyse the montaged image as a single data set

• Collect >1500 fields

• Automatic field alignment during acquisition using image correlation

• Keeps the sample in focus over the complete sample area, even when the sample Is not flat

• Best illustrated with some examples…

Page 57: Presentations EBSD

Page 57 © Oxford Instruments 2015

The Business of Science®

Data Acquisition

Page 58: Presentations EBSD

Page 58 © Oxford Instruments 2015

The Business of Science®

Coarse Grained Mantle Xenolith

1cm

Forsterite IPF

1cm

Cr Map

1cm

Acknowledge University of Otago

• Montaged data set can be interrogated as a single site of interest

Page 59: Presentations EBSD

Page 59 © Oxford Instruments 2015

The Business of Science®

Folded Rolled Nickel Sheet

1000um

• Grain Boundary map shows: • Black = high angle grain

boundary • Red = twin boundaries • Grey low angle

boundary <2° • Indicate regions of

deformation in sheet

• Gas pipeline material, examine texture changes through fold • Link texture to corrosion

• 90 fields collected over Ni sheet • Large area mapping and montaging provides an overview of the

whole sample at a high level of detail:

Page 60: Presentations EBSD

Page 60 © Oxford Instruments 2015

The Business of Science®

1000um

• Rolled Ni sheet, 100 fields • IPF X map, systematic texture variation associated with folding

Folded, Rolled Nickel Sheet

Page 61: Presentations EBSD

Page 61 © Oxford Instruments 2015

The Business of Science®

AZtec LAM – Image Registration

• The montaged image is automatically registered in AZtec and can be used for relocation and navigation

• The montaged image (or other Aztec image) can be imported into AZtec at a later date, re-registered using fiducial markers - and used to relocate to regions of interest on the specimen

Page 62: Presentations EBSD

Page 62 © Oxford Instruments 2015

The Business of Science®

MapQueue

• Individual point mapping experiments can be queued up

• Each mapping experiment (EDS or EBSD) can have different resolutions, dwell times, solver settings, Phase lists...

• Each point acquisition can be EDS, EBSD or both

Page 63: Presentations EBSD

Page 63 © Oxford Instruments 2015

The Business of Science®

• Powerful variation of EBSD

• Lots of interest

• Many papers / conference talks

• Applies standard EBSD system to an electron transparent sample

• Sample close to horizontal with short working distance

• Optimise spatial resolution

Transmission Kikuchi Diffraction

Page 64: Presentations EBSD

Page 64 © Oxford Instruments 2015

The Business of Science®

• Al sample

• Pattern distortion resulting from TKD geometry causes wider bands in the lower pattern

• Non symmetric intensity seen in the broad bands

• This results in inaccuracy in the band detection

Challenges with Transmission Kikuchi Diffraction

Typical TKD pattern

• TKD Optimised Mode

• With new band detection bands are correctly detected

MAD = 1.1

MAD = 0.13

Page 65: Presentations EBSD

Page 65 © Oxford Instruments 2015

The Business of Science®

• In this mode a new band detection routine is applied which is more accurate

• It takes into account the band position relative to the pattern centre and detector position

• As a result can work with the sample close to horizontal at short working distance

• Optimising spatial resolution

TKD Optimised Mode

2um

Strained nanocrystalline copper sample showing IPF-Z

direction, high angle boundaries in black and CSL boundaries in colour. Step size 4nm.

Credit: Saritha Samudrala (University of Sydney) and Kevin Hemker (Johns Hopkins University)

Page 66: Presentations EBSD

Page 66 © Oxford Instruments 2015

The Business of Science®

• All data can be exported to the post processing packages

• 64bit so can handle large data sets

• Large number of processing and display options

• Include clean up functionality

• Capability to create subsets

• Creation of crystallographic data files

Data Analysis Improvements

Page 67: Presentations EBSD

Page 67 © Oxford Instruments 2015

The Business of Science®

• The map data values for grain and grid maps created in Tango can now be exported as a text file

• This means the map calculations can be used as input into other third party software

• The calculated (M)ODF values can also be exported as a text file

Data Analysis Improvements

Page 68: Presentations EBSD

Page 68 © Oxford Instruments 2015

The Business of Science®

• New grain sizing filters introduced which follow the ISO DIS13067

• Easier to filter the data so that clusters which are too small to be considered as a grain can be removed from the grain statistics.

Data Analysis Improvements

Page 69: Presentations EBSD

Page 69 © Oxford Instruments 2015

The Business of Science®

• Export of the Grain ID together with the orientation data – added to the Record Browser

• Texture components modified so if multiple components are used at the same time then the data pixels can only contribute to one component, easing calculation of area fractions

• Axis alignment component to get boundary fraction fulfilling a given criteria

Data Analysis Improvements

Page 70: Presentations EBSD

Page 70 © Oxford Instruments 2015

The Business of Science®

•Visualises substructures in the sample.

• The average orientation is determined for each grain. The deviation from this mean orientation is then plotted for each pixel – within that grain.

Data Analysis Improvements – New Maps • GROD Grain Reference Orientation Deviation (GROD) Angle

Page 71: Presentations EBSD

Page 71 © Oxford Instruments 2015

The Business of Science®

• The average orientation is determined per grain.

• The axis around which the orientation is rotated is calculated and displayed as a colour

• Those grains which are ‘speckled’ have an orientation which is close to the mean

Data Analysis Improvements – New Maps

Grain Reference Orientation Deviation (GROD) Axis

Page 72: Presentations EBSD

Page 72 © Oxford Instruments 2015

The Business of Science®

• The GROD Hyper combines both the axis and angle, relative to the mean orientation of the grain

• This map combines 4 coordinates (from the axis, x,y & z, and the angle) in a 3D colour space to display subtle internal grain structures.

• This map is a visual representation but is not a quantification of the data.

Data Analysis Improvements – New Maps • Grain Reference Orientation Deviation (GROD) Hyper

Page 73: Presentations EBSD

Page 73 © Oxford Instruments 2015

The Business of Science®

• Range of applications for EBSD is growing

• Increasing requirements to understand how microstructure influences materials behaviour

• Manufacture higher performing materials

• Interest in technique is growing

• Faster acquisition

• Smaller features

• Larger Samples

• Higher accuracy

• More challenging applications

• AZtec is solution for all applications

Summary