Flash Memory For Automativedcslab.hanyang.ac.kr/nvramos16/presentation/d3.pdf ·  ·...

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이에프텍 Flash Memory For Automative 2016 10 1 Do not distribute without permission

Transcript of Flash Memory For Automativedcslab.hanyang.ac.kr/nvramos16/presentation/d3.pdf ·  ·...

Page 1: Flash Memory For Automativedcslab.hanyang.ac.kr/nvramos16/presentation/d3.pdf ·  · 2016-10-20직사광선노출 115C 105C. Data retention loss • For 19nm MLC (Multi-Level Cell)

이에프텍

Flash Memory For Automative

2016 10

1

Do not distribute without permission

Page 2: Flash Memory For Automativedcslab.hanyang.ac.kr/nvramos16/presentation/d3.pdf ·  · 2016-10-20직사광선노출 115C 105C. Data retention loss • For 19nm MLC (Multi-Level Cell)

2007년 시작

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2011년 6th

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2015년 9th

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Automotive Flash

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NAND for Automotive

• More storage requires NAND– Navigation, ADAS, Infotainment and Black-box

• NAND is acceptable for the dashboard or a head unit – Under -20C to 85

• Data retention on high temperature is critical issue

장치의 장착위치 저장온도 동작온도

직사광선 노출 안됨 85C 75C

직사광선 노출 근처 95C 85C

직사광선 노출 115C 105C

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Data retention loss

• For 19nm MLC (Multi-Level Cell) NAND the acceleration factors for retention degradation are 6.5 at 55°C and a fatal 168 at 85°C which means that stored data is definitely corrupted after a few months without additional countermeasures.

출처:

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AEQ-Q100

• High Temp Program/Erase Endurance Cycling• 85C, cycling for 15% of product life time : 1/3 time on full area, 3/1

time on 10% area, 1/3 time on the rest of area (90%)

– High Temp Data Retention(HTDR)

• Example) 150C bake 40 hr

– High Temp Operating Life (HTOL)

• 90C R/W for 408 hours OR 70C R/W for 1000 hours

• High speed

• Low Temp Program/Erase Endurance Cycling procedure• 55C, cycling for 15% of product life time

– Low Temp Data Retention(HTDR) procedure

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Customer Requirement

테스트명 시나리오

High Temp 85C, Read/Write, 2000Hours

Low Temp -25C, Read/Write, 100Hours

Cross Temp -25~85C 1000cycle, Read/Write

High Temp+SPOR 85C 2000Hours with SPOR 5K

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EFTech Industrial eMMC/SD Tester

• Test solution for industrial eMMC/SD – Smart test cases and monitor/control GUI program– Chamber & test board

• Working temperature test with high speed interface– AP based chamber solution for 128 para

– Working temperature : -40C to 120C

• Industrial Tester overview– Functional/power-cycle test– endurance/retention test with burn-in– Performance benchmark

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Recent Test Result for automotive SD

• All Sdcards of 5 makers could not pass our room temp SPOR test– Power cycle test fails within 100 ~ 1K

– Write/read timeout with SPOR

• Recommendation : Buy S-Sdcard or T-Sdcard on Gmarket !!

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System Configuration of NAND application

• Navigation : Map-SD and OS-embedded flash– eMMC on Wince/linux

– MLC NAND + S/W FTL + Wince/linux

• Is it Strong FTL ?

• Driver Monitoring system– SoC + SLC NAND in one chip package

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Automotive & Robotics

• New Market & New Challenge

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ABB Industrial Robot

Softbank PePe

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New S/W Tech

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Endurance(X) : Retention(Y) : Performance(Z)

Target Specific Requirement

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Q&A : [email protected]