An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖...

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Transcript of An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖...

Page 1: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

An Approach to Thermal Placement in MCM Using

Thermal Force Model

黎 靖

南台科技大學電子系

Page 2: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

Problem

• Assign chips to chip sites such that the system failure rate of a MCM is minimized.

x

Chips Chip sites Active substrate

py

p

Realsubstrate

Page 3: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

Failure rate

• Failure rate of a chip is estimated by

. System failure rate is

T

1

298

1

kEaexpo

m

1iiS T

Page 4: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

Typical MCM

Heat Sink

Cap

Thermal Grease

C4

Multi-layer Substrate ChipI/O Pad

Page 5: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

II. Multiple Reflection Technique

Q

(a) A rectangle region with insulated boundaries (b) An unbounded region with infinite mirror heat sources .

Q Qi iQi

Qi

Qi

Qi

Qi

Qi

Qi

Qi

QiQi

Qi

W

L

Qi

Qi

Qi

Qi

QiQi

Qi

Qi

Qi

Qi

L

W iQj Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Qj

Y

X

row=0

row=1

row=2

row=-1

row=-2

column=2column=1column=0column=-1column=-2

Qi Qi

Transform a bounded substrate into an unbounded region.

Page 6: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

III. Thermal-Force model

1. Force on Ci caused by Cj :

2. Thermal-force exerts on Ci

m

1j

1a

1ar

a)(r,ji,

a)(r,ji,

1a

a

ac

c)(a,ji,

c)a,(ji,

(0,0)ji,i fffffF

2ji,

jji,

)r(

qf

3. Thermal placement problem is reduced to the problem of solving a set of simultaneous linear equations to determine zero-thermal-force locations for chips.

4. A modified Newton-Raphson method is used to solve this system of equations.

Page 7: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

PLACEMENT PROCEDURE

• Initial placement

• Zero-force placement • Chip Assignment

Page 8: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

Initial placement

Ring I Ring II Ring III

1

1

1

1

2

2

2

2

3

3

3

34

4

4

4

5

5

5

5

1

2

3

4

5

8

6

7

9

10

11

12

13

14

15

16

17

18

19

20

C

C

C

C

C

C C

C

CCCC

C C C C C

C

C

C

Page 9: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.
Page 10: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.
Page 11: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.
Page 12: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

MCM Information

Modules Chips Power dissipation value

(power × chip number)

A 29 30W×12、 27W×2、 25W×4、 16W×8、13W×2、 7W×1

B 31 30W×14、 27W×2、 25W×4、 16W×8、13W×2、 7W×1

C 110 20W×17、 19.5W×4、 17.3W、 16.9W×8、 15W×2、14.7W×1、 14.3W×1、 13.9W×1、 13.8W×1、 13.6W×1、 10.9W×1、 10W×1、 8.9W×71

Page 13: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

ResultsA B C

IBM Our IBM Our IBM Our

Tmax 108 107 115 112 228 185

Tmin 80 82 88 85 100 145

28 25 27 27 128 40

S 1 0.89 1 0.96 1 0.23

maxT

Page 14: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

IBM 128(8.9)

173(16.9)

134(8.9)

137(8.9)

134(8.9)

138(8.9)

141(8.9)

141(8.9)

139(8.9)

135(8.9)

128(8.9)

124(8.9)

142(8.9)

149(8.9)

152(8.9)

158(8.9)

171(15)

157(8.9)

149(8.9)

144(8.9)

139(8.9)

131(8.9)

148(8.9)

192(16.9)

185(10.9)

191(16.9)

172(16.9)

147(8.9)

136(8.9)

138(8.9)

150(8.9)

166(8.9)

204(20)

218(20)

220(19.5)

218(20)

205(20)

167(8.9)

152(8.9)

139(8.9)

135(8.9)

148(8.9)

168(8.9)

213(20)

226(20)

228(19.5)

227(20)

216(20)

174(8.9)

156(8.9)

139(8.9)

170(10)

215(20)

215(14.3)

216(13.6)

214(13.9)

217(20)

194(17.3)

169(14.7)

135(8.9)

148(8.9)

168(8.9)

213(20)

226(20)

227(19.5)

222(20)

208(20)

170(8.9)

154(8.9)

139(8.9)

138(8.9)

150(8.9)

165(8.9)

204(20)

217(20)

218(19.5)

210(20)

159(8.9)

150(8.9)

138(8.9)

137(8.9)

148(8.9)

173(16.9)

192(16.9)

190(13.8)

187(16.9)

168(16.9)

146(8.9)

136(8.9)

133(8.9)

127(8.9)

141(8.9)

148(8.9)

151(8.9)

157(8.9)

171(15)

156(8.9)

148(8.9)

145(8.9)

140(8.9)

131(8.9)

133(8.9)

137(8.9)

140(8.9)

140(8.9)

139(8.9)

138(8.9)

136(8.9)

131(8.9)

125(8.9)

Page 15: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

Our179(20)

183(19.5)

179(20)

176(20)

174(20)

176(20)

155(8.9)

166(13.6)

179(20)

155(8.9)

160(8.9)

158(8.9)

154(8.9)

168(16.9)

167(16.9)

169(14.7)

157(8.9)

160(8.9)

177(16.9)

154(8.9)

158(8.9)

167(13.8)

152(8.9)

145(8.9)

152(8.9)

156(8.9)

160(8.9)

180(20)

179(19.5)

161(8.9)

157(8.9)

152(8.9)

148(8.9)

147(8.9)

148(8.9)

152(8.9)

157(8.9)

175(16.9)

160(8.9)

184(20)

158(8.9)

152(8.9)

150(8.9)

150(8.9)

150(8.9)

153(8.9)

157(8.9)

162(8.9)

182(20)

178(20)

161(8.9)

156(8.9)

153(8.9)

151(8.9)

151(8.9)

152(8.9)

155(8.9)

160(8.9)

164(8.9)

185(20)

170(15)

156(8.9)

153(8.9)

152(8.9)

151(8.9)

152(8.9)

156(8.9)

183(20)

177(15)

161(8.9)

173(20)

174(16.9)

156(8.9)

153(8.9)

152(8.9)

152(8.9)

152(8.9)

152(8.9)

171(13.9)

180(19.5)

153(8.9)

153(8.9)

154(8.9)

154(8.9)

154(8.9)

154(8.9)

156(8.9)

155(8.9)

152(8.9)

157(8.9)

154(8.9)

154(8.9)

152(8.9)

16.7(16.9)

165(14.3)

176(16.9)

172(16.9)

177(20)

158(8.9)

154(10)

173(20)

157(10.9)

172(19.5)

146(8.9)

174(20)

150(8.9)

146(8.9)

151(8.9)

171(17.3)

173(20)

Page 16: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

TCM, 1981

Page 17: An Approach to Thermal Placement in MCM Using Thermal Force Model 黎 靖 南台科技大學電子系.

Conclusion

• A force-directed technique based on thermal force model is proposed for the reliability-driven placement problem.

• The experimental results show that the present method can generate placements with lower system failure rate than their original designs.