25.

ICICIC

IC/

(Probe test)

IC50%

I/O port(Peripheral)(Area Array)1[1]/ICDRAMSRAM/ASIC[2]ICI/O Port2010ICI/O Port10000 [3]

SIP(System in Package)(Flip Chip)

ICI/O PortIC

IC

(Pad)(Bump)

(Al)(Cu)

(Sn)(Pb)

(Compliant)

(Micro-electro-mechanical system, MEMS)

(Epoxy Ring Probe Card)(Vertical Probe Card) (MEMS Probe Card)

2

3

(Pitch)

(>1 GHz)

4

100 m

121

(System on Chip)

3.1

5

(high touchdown)(ultra fine pitch)

CMOS(chip on system)

(out-of-plane)

LCDIC

[6-8]

3.2 56

7ICI/O Port

3.3

8

9(reflow)(void)

10

3.4

11 (a) P(100)1m (b) BOE (c) KOH (d) 4000 (e) (f)

122 mSEM131415

122

[1] http://www.mjc.co.jp/eng/product/index3_4.html[2] K. J. Puttlitz, P. A. Totta, Area array interconnection

handbook, Springer; 1st edition, Sep. 2001.[3] T. Hantschel, L. Wong, C. L. Chua, D. K. Fork,

Fabrication of highly conductive stressed-metal springs and their use as sliding-contact interconnects, Microelectronic Engineering, Volumes 67-68, pp. 690-695, June 2003.

[4] http://www.accuprobe.com/Downloads/PT19%20Epoxy%20Ring%20Replacement.pdf

[5] http://www.kns.com[6] K. Kataoka, S. Kawamura, T. I toh, T. Suga,

K. Ishikawa and H. Honma, Low contact-force and compliant MEMS probe card utilizing frittingcontact, Micro Electro Mechanical Systems, The Fifteenth IEEE International Conference, pp.364 367, 2002.

[7] K. Shingo, K. Kataoka, T. Itoh, and T. Suga, Design and fabrication of an electrostatically actuated MEMS probe card, TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, Vol. 2, pp.1522 - 1525, 2003.

[8] Y. M. Kim, H. C. Yoon, and J. H. Lee, Silicon micro-probe card using porous silicon micromachining technology, Electronics and Telecommunications Research Institute, Vol.27, No4, pp.433-438, 2005.

1[1]

2[4]

3:

4[5]

5

123

6

7(a) (b)

8

9

10

11

12

13SEM

14SEM

15SEM

124